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In a crystalline solid under mechanical stress, a Frank-Read source is a pinned dislocation segment that repeatedly bows and detaches, generating concentric dislocation loops. We demonstrate that, in nematic liquid crystals, an analogous Frank-Read mechanism can generate concentric disclination loops. Using experiment, simulation, and theory, we study a disclination segment pinned between surface defects on one substrate in a nematic cell. Under applied twist of the nematic director, the pinned segment bows and emits a new disclination loop which expands, leaving the original segment intact; loop emission repeats for each additional 180° of applied twist. We present experimental micrographs showing loop expansion and snap-off, numerical simulations of loop emission under both quasistatic and dynamic loading, and theoretical analysis considering both free energy minimization and the balance of competing forces. We find that the critical stress for disclination loop emission scales as the inverse of segment length and changes as a function of strain rate and temperature, in close analogy to the Frank-Read source mechanism in crystals. Lastly, we discuss how Frank-Read sources could be used to modify microstructural evolution in both passive and active nematics. 

In 3D nematic liquid crystals, disclination lines have a range of geometric structures. Locally, they may resemble +1/2 or −1/2 defects in 2D nematic phases, or they may have 3D twist. Here, we analyze the structure in terms of the director deformation modes around the disclination, as well as the nematic order tensor inside the disclination core. Based on this analysis, we construct a vector to represent the orientation of the disclination, as well as tensors to represent higher-order structure. We apply this method to simulations of a 3D disclination arch, and determine how the structure changes along the contour length. We then use this geometric analysis to investigate three types of forces acting on a disclination: Peach–Koehler forces due to external stress, interaction forces between disclination lines, and active forces. These results apply to the motion of disclination lines in both conventional and active liquid crystals. 

A substrate was patterned with two pairs of half-integer strength topological defects, (+½, +½) and (+½, −½). In a sufficiently thick cell, a disclination line runs in an arch above the substrate connecting the two half integer defects within each pair. The director around the disclination line for the like-sign pair must rotate in 3D, whereas for the opposite-sign defect pair the director lies in the xy-plane parallel to the substrate. For a negative dielectric anisotropy nematic, an electric field applied normal to the substrate drives the director into the xy-plane, forcing the arch of the disclination line of the like-sign pair to become extended along the z-axis. For sufficiently large field the arch splits, resulting in two nearly parallel disclination lines traversing the cell from one substrate to the other. The opposite-sign defect pair is largely unaffected by the electric field as the director already already lies in the xy-plane. Experimental results are presented, which are consistent with numerical simulations.